Michael Barrett joined Fulbright & Jaworski L.L.P.'s Austin office in 2000, coming from the Austin office of Arnold, White & Durkee. He focuses on patent litigation, prosecution, and analysis in various technology areas. For example, he has experience in the electrical, semiconductor, imaging, telecommunications, computer hardware, computer software, mechanical, medical, software, nanotechnology, microfluidics, and chemical fields. His transactional experience includes all phases of prosecution, opinion work, and portfolio management. His litigation experience includes all phases of litigation up to jury-trial preparation, including pre-litigation analysis, pleadings, discovery, depositions, and court hearings.

Prior to becoming a lawyer, Michael worked as a Research Assistant for The University of Texas Physics Department and a Cooperative Engineer at Advanced Micro Devices. He researched semiconductor materials using atomic force microscopy, scanning tunneling microscopy, electron microscopy, and x-ray spectroscopy. His research resulted in a patented procedure for profiling integrated circuits in two-dimensions using chemical etching.

Michael has represented university clients throughout the country. Corporate clients include prominent semiconductor, integrated circuit, telecommunications, radar, nanotechnology, defense, medical device, health-provider, and chemical companies.

• American Intellectual Property Law Association
• American Bar Association
• Austin Intellectual Property Law Association
• Austin Young Lawyers Association
• Travis County Bar Association

• The Best Lawyers in America, Intellectual Property Law (2010)

• Co-author with Miriam Latorre Quinn, "Senate and House of Representatives Bills Seek to Undo Supreme Court Rulings on Pleading Standards," Fulbright & Jaworski L.L.P. Briefing, December 14, 2009
• Co-author with Richard Zembek, Marc Delflache, K. Rachelle Goldman, "Quanta Computer, Inc. v. LG Electronics -Supreme Court Limits Patentees' Ability to Sue on Downstream Combinations," Fulbright & Jaworski L.L.P. Intellectual Property Briefing, June 2008
• Contributor, Patent Law Handbook, West Group, 1999-2000 edition
• "Method for Measuring Concentration of Dopant within a Semiconductor Substrate," Inventor: U.S. Patent No. 5,520,769, issued May 28, 1996
• "2-D Dopant Profiles of VLSI Devices Using Dopant-Selective Etching: an Atomic Force Microscopy Study," IEEE Electron Device Letters, Vol. 16, p. 118, 1995

1998 - J.D., cum laude, The University of Texas School of Law
1995 - M.A., Physics, The University of Texas at Austin
1993 - B.S., summa cum laude, Physics, Texas A&M University

Michael is a member of the State Bar of Texas. He has been admitted to practice law before the District Court for the Western District of Texas, the Southern District of Texas, and the Federal Circuit. He is also registered to practice before the United States Patent and Trademark Office.